Paper
27 November 1989 Application Of X-Ray Focussing Optics To A Synchrotron Based X-Ray Microprobe
A. C. Thompson, J. H. Underwood, Y. Wu, R. D . Giauque, K. W. Jones, M. L. Rivers, R, G. Futernick
Author Affiliations +
Abstract
A synchrotron radiation based x-ray microprobe allows the analysis of samples with higher spatial resolution and better elemental sensitivity than is possible with laboratory x-ray sources. In addition, the development of high efficiency x-ray mirrors using multilqyer coated optical mirrors now permits the achievement of spot sizes of less than 100μm2 Since samples to be studied in an x-ray microprobe do not have to be placed in a vacuum, almost any sample can be conveniently analyzed. Examples of samples that can be studied are fluid inclusions in quartz rocks, blue-green algae filaments, "fox" marks on old documents and ink on old documents.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. C. Thompson, J. H. Underwood, Y. Wu, R. D . Giauque, K. W. Jones, M. L. Rivers, and R, G. Futernick "Application Of X-Ray Focussing Optics To A Synchrotron Based X-Ray Microprobe", Proc. SPIE 1140, X-Ray Instrumentation in Medicine and Biology, Plasma Physics, Astrophysics, and Synchrotron Radiation, (27 November 1989); https://doi.org/10.1117/12.961799
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KEYWORDS
X-rays

X-ray optics

Mirrors

Synchrotrons

Statistical analysis

Zinc

Synchrotron radiation

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