Paper
6 December 1989 Improved Stability Of Ti:LiNbO3 Devices By Using ITO Electrodes
M. Kowalsky, A. Neyer, W. Mevenkamp, F. Rottmann, T. Pohlmann, E. Voges
Author Affiliations +
Proceedings Volume 1141, 5th European Conf on Integrated Optics: ECIO '89; (1989) https://doi.org/10.1117/12.961922
Event: 1989 International Congress on Optical Science and Engineering, 1989, Paris, France
Abstract
DC-stability is one of the most serious problems in Titanium diffused LiNbO3 devices leading to a temporal change of the output power of optical modulators and switches. In this contribution the influence of Indium-Tin-Oxide (ITO) electrodes on the long term (hours) dc stability of Ti:LiNb01 devices is investigated in comparison with metal (aluminium) electrodes directly deposited on the LiNb03. The technology of the ITO-electrodes is described. Interferometric Ti:LiNb03 switches on x-cut substrates have been used as test devices. The drift was characterized by tracing the drive point voltage as a function of time and applied dc bias. Our main result is that the interferometers with aluminium electrodes showed a voltage drift of the operation point of > 10 % over a time period of several hours, whereas the devices with ITO-electrodes only showed a slight initial drift and remained stable afterwords.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. Kowalsky, A. Neyer, W. Mevenkamp, F. Rottmann, T. Pohlmann, and E. Voges "Improved Stability Of Ti:LiNbO3 Devices By Using ITO Electrodes", Proc. SPIE 1141, 5th European Conf on Integrated Optics: ECIO '89, (6 December 1989); https://doi.org/10.1117/12.961922
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KEYWORDS
Electrodes

Switches

Aluminum

Interferometers

Titanium

Interferometry

Metals

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