Research on high sensitivity test technology of single photon remote detection system

Jie Fu; Guofeng Zheng; Baolin Du; Shiyong Guo; Peng Zhang

doi:10.1117/12.2565183

17 April 2020 Research on high sensitivity test technology of single photon remote detection system

Jie Fu, Guofeng Zheng, Baolin Du, Shiyong Guo, Peng Zhang

Proceedings Volume 11455, Sixth Symposium on Novel Optoelectronic Detection Technology and Applications; 114555T (2020) https://doi.org/10.1117/12.2565183
Event: Sixth Symposium on Novel Photoelectronic Detection Technology and Application, 2019, Beijing, China

Abstract

In this paper, the test environment of all-state single-photon remote detection system established in the laboratory is introduced. In this environment, a noise-free test environment is established, and a quantitative measurement device is established for the sensitivity test of the single-photon receiving system, and the sensitivity test can be carried out without background noise and background noise so as to verify the compliance of the design. And a dynamic target algorithm verification environment is established to test the single-photon dynamic algorithm. The test system is matched with a narrow line-width high-repetition frequency test device, and basically can test the main performance indexes of single-photon, and provides technical support for the design and development of a single-photon remote test system.

Citation Download Citation

Jie Fu, Guofeng Zheng, Baolin Du, Shiyong Guo, and Peng Zhang "Research on high sensitivity test technology of single photon remote detection system", Proc. SPIE 11455, Sixth Symposium on Novel Optoelectronic Detection Technology and Applications, 114555T (17 April 2020); https://doi.org/10.1117/12.2565183

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