Two entangled electrons (photons) microscopy

Akbar Rahmani Nejad; Ali Rahmani Nejad

doi:10.1117/12.2581761

8 November 2020 Two entangled electrons (photons) microscopy

Akbar Rahmani Nejad, Ali Rahmani Nejad

Proceedings Volume 11525, SPIE Future Sensing Technologies; 115250G (2020) https://doi.org/10.1117/12.2581761
Event: SPIE Future Sensing Technologies, 2020, Online Only

Abstract

Inspired by the concept of quantum entangled radars, the extraordinary and utterly innovative concept of no-detectors microscope-imaging by the implementation of entangled quantum particles such as electrons as the probe of the microscope is touched on. Instead of simultaneous measurement of two entangled particles, we propose repetitive measuring idler electrons in two conditions; when the object does not reflect the signal that means there is an entanglement exists. Otherwise, when entanglement is broken or degraded, it means a reflection or absorption of the signal electron. It is showed that the repetitive measurement of entanglement among a sequence of idlers in the two above mentioned conditions approaches different values. When entanglement measurement showed the collapse of entanglement, it concludes the hitting of the probe particle to the object has happened. The number of broken entanglement between idle electrons is considered proportional to the number of detected electrons by the detector and imaging is accomplished by this assumption. For a 3D visualization of the object, a curve fitting algorithm available in the field of Computer Science is applied. The fitted curve illustrates an approximate surface of the object.

Conference Presentation

Citation Download Citation

Akbar Rahmani Nejad and Ali Rahmani Nejad "Two entangled electrons (photons) microscopy", Proc. SPIE 11525, SPIE Future Sensing Technologies, 115250G (8 November 2020); https://doi.org/10.1117/12.2581761

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