Presentation + Paper
15 February 2021 Evaluation of edge-illumination and propagation-based x-ray phase contrast imaging methods for high resolution imaging application
Author Affiliations +
Abstract
The aim of this study is to investigate and reveal the potential of employing a direct conversion amorphous selenium (a-Se) CMOS based high resolution x-ray detector in both propagation-based (PB) and edge illumination (EI) x-ray phase contrast imaging (XPCi) techniques. Both PB-XPCi and EI-XPCi modalities are evaluated through a numerical model and are compared based on their contrast, edge-enhancement, visibility, and dose efficiency characteristics. It is demonstrated how EI-XPCi configuration outperforms the PB-XPCi one considering using the same x-ray source and detector. After highlighting the strength of EI-XPCi system and reviewing today’s XPCi technologies, absorption mask grating fabrication is addressed as the main challenge to upgrade and improve EI-XPCi setups to higher resolution detectors. Mammography is considered as a case study to elucidate the importance of employing a high resolution EI-XPCi technique for microcalcification detection through numerical simulation of a breast phantom.
Conference Presentation
© (2021) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Abdollah Pil-Ali, Sahar Adnani, Christopher C. Scott, and Karim S. Karim "Evaluation of edge-illumination and propagation-based x-ray phase contrast imaging methods for high resolution imaging application", Proc. SPIE 11595, Medical Imaging 2021: Physics of Medical Imaging, 115951N (15 February 2021); https://doi.org/10.1117/12.2582225
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CITATIONS
Cited by 1 scholarly publication.
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KEYWORDS
X-rays

Image resolution

X-ray imaging

X-ray detectors

Absorption

Data modeling

Mammography

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