Paper
26 January 2021 Analysis of electrical contact surface characteristics of aeronautical electrical circuit based on infrared thermography
Shiyong Hao, Xiangyang Yu, Ning Xu, Shoumiao Yu, Chunfeng Yu, Ziran Qin, Yawen Yang
Author Affiliations +
Proceedings Volume 11767, 2020 International Conference on Optoelectronic Materials and Devices; 117671O (2021) https://doi.org/10.1117/12.2592388
Event: 2020 International Conference on Optoelectronic Materials and Devices, 2020, Guangzhou, China
Abstract
A method for analyzing the surface characteristics of electrical contact of aeronautical electrical lines based on infrared thermography was proposed. Through the analysis of electric contact reliability model, it is considered that contact material, contact form and surface condition are the main factors affecting contact resistance. In the actual working environment, oxidation and oil pollution can increase the resistance of the electrical contact film, resulting in the "deterioration" of the surface condition. Taking the universal electric connection components as the electric contact carrier, the electrification experiment is conducted according to the different development degrees of oil pollution under the action of rated working current. Based on the surface temperature spectrum analysis, it is concluded that after a certain time of heat accumulation, the distribution characteristics of temperature contraction lines on the electrical contact surface can reflect the development degree and difference of surface deterioration to a certain extent. It has certain technical traction and reference value for the evaluation of electrical contact reliability.
© (2021) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shiyong Hao, Xiangyang Yu, Ning Xu, Shoumiao Yu, Chunfeng Yu, Ziran Qin, and Yawen Yang "Analysis of electrical contact surface characteristics of aeronautical electrical circuit based on infrared thermography", Proc. SPIE 11767, 2020 International Conference on Optoelectronic Materials and Devices, 117671O (26 January 2021); https://doi.org/10.1117/12.2592388
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
Back to Top