High-precision optical coordinate metrology for punching tools by using a digital twin for the measurement strategy

Kerstin Zangl; Reinhard Danzl; Michael Kreil; Franz Helmli

doi:10.1117/12.2618469

31 May 2022 High-precision optical coordinate metrology for punching tools by using a digital twin for the measurement strategy

Kerstin Zangl, Reinhard Danzl, Michael Kreil, Franz Helmli

Author Affiliations +

Proceedings Volume 12098, Dimensional Optical Metrology and Inspection for Practical Applications XI; 1209804 (2022) https://doi.org/10.1117/12.2618469
Event: SPIE Defense + Commercial Sensing, 2022, Orlando, Florida, United States

Abstract

The requirements in optical dimensional coordinate metrology are often not only to fulfill the measurement task but also to define the measurement strategy. One application of relevance is the automatic quality assurance of punching and stamping tools, which is often directly integrated into the manufacturing process. The measurement of surface finishes and micro-geometries with tolerances down to the sub-μm range has a decisive influence on the quality, reliability, and durability of such high-precision components. The challenge of the measuring task consists of measuring complex micro geometries on free-form surfaces on the top as well as the vertical reference surfaces on the side. Existing tactile methods often do not allow high-resolution measurements of such free-form surfaces or require long measuring times. Existing optical measurement systems typically have a limited performance with respect to measurable slope angles. For an automatic measurement process, measurement planning as e.g., the number of measurements, their positions and probing directions are essential for high-accurate and repeatable measurements. The proposed measurement solution based on an optical micro-coordinate measurement machine (μCMM) using advanced focus variation offers advantages in terms of the complete application including the measurement strategy. Focus variation and vertical focus probing enables the measurement of the free-form top-surface and the measurement of the vertical surfaces by optical lateral probing. The μCMM metrology software provides algorithms that support the user in technology-based optimal measurement planning on CAD data by e.g., suggestions in terms of measurement method, probing direction or offline collision detection using a digital twin of the μCMM.

Conference Presentation

Citation Download Citation

Kerstin Zangl, Reinhard Danzl, Michael Kreil, and Franz Helmli "High-precision optical coordinate metrology for punching tools by using a digital twin for the measurement strategy", Proc. SPIE 12098, Dimensional Optical Metrology and Inspection for Practical Applications XI, 1209804 (31 May 2022); https://doi.org/10.1117/12.2618469

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