Phase retrieval using least absolute deviations for Fourier ptychographic microscopy

Xiaoming Jiang; Tian Wang; Zhonghua Zhang; Chunhong Lai

doi:10.1117/12.2617194

15 February 2022 Phase retrieval using least absolute deviations for Fourier ptychographic microscopy

Xiaoming Jiang, Tian Wang, Zhonghua Zhang, Chunhong Lai

Proceedings Volume 12166, Seventh Asia Pacific Conference on Optics Manufacture and 2021 International Forum of Young Scientists on Advanced Optical Manufacturing (APCOM and YSAOM 2021); 1216649 (2022) https://doi.org/10.1117/12.2617194
Event: Seventh Asia Pacific Conference on Optics Manufacture and 2021 International Forum of Young Scientists on Advanced Optical Manufacturing (APCOM and YSAOM 2021), 2021, Hong Kong, Hong Kong

Abstract

Fourier ptychographic microscopy (FPM) undergoes fast development since its proposal. In FPM, a large number of small images using small numerical aperture (NA) objective lens is generally required for the process of high-resolution image reconstruction. Although various methods have been proposed to shorten the acquisition time or reconstruct the image using sparse sample of full data, the scientific question is still there, i.e. where is the boundary of extreme sparse sampling for FPM, either from the theory or experimental perspective. In this paper, based on the in-house Incremental Inverse Dynamical Photon scattering (IIDPS) framework, we report that this artificial neural network based method, utilizing least absolute deviations error metric instead of the commonly used mean square error metric, is able to reconstruct image at very low sampling rate the simulation data for FPM, i.e. 5.67%, that is much lower than the reported results while other traditional method, like Gerchberg-Saxton-type method or other similar method, could not perform successful image reconstruction at such low sampling rate.

Citation Download Citation

Xiaoming Jiang, Tian Wang, Zhonghua Zhang, and Chunhong Lai "Phase retrieval using least absolute deviations for Fourier ptychographic microscopy", Proc. SPIE 12166, Seventh Asia Pacific Conference on Optics Manufacture and 2021 International Forum of Young Scientists on Advanced Optical Manufacturing (APCOM and YSAOM 2021), 1216649 (15 February 2022); https://doi.org/10.1117/12.2617194

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KEYWORDS

Phase retrieval

Reconstruction algorithms

Data modeling

Microscopy

Image processing

Scattering

Algorithm development

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