Compact disc inspection through measurement of low birefringence

Arkady S. Voloshin

doi:10.1117/12.2294679

1 July 1990 Compact disc inspection through measurement of low birefringence

Arkady S. Voloshin

Proceedings Volume 1230, International Conference on Optoelectronic Science and Engineering '90; 123016 (1990) https://doi.org/10.1117/12.2294679
Event: The Marketplace for Industrial Lasers 1990, 1990, Chicago, IL, United States

Abstract

Recent increase in use of compact discs attracted more attention to the problem of the quality control. Since those discs are made form polycarbonate they may exhibit birefringence introduced during manufacturing process. Such birefringence changes the index of refraction of the polycarbonate, which in turn causes deviation of the reading laser ray from rectilinear path. Currently available devices utilize laser based systems for reading of residual birefringence during disc rotation. As a result, this process is time consuming and provides averaged through the circular track information.

Citation Download Citation

Arkady S. Voloshin "Compact disc inspection through measurement of low birefringence", Proc. SPIE 1230, International Conference on Optoelectronic Science and Engineering '90, 123016 (1 July 1990); https://doi.org/10.1117/12.2294679

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