System with high resolution for measurement of ultrashort pulse

Zhenglie Gong

doi:10.1117/12.2294725

1 July 1990 System with high resolution for measurement of ultrashort pulse

Zhenglie Gong

Proceedings Volume 1230, International Conference on Optoelectronic Science and Engineering '90; 12302G (1990) https://doi.org/10.1117/12.2294725
Event: The Marketplace for Industrial Lasers 1990, 1990, Chicago, IL, United States

Abstract

The duration of ultrashort light pulse gets from ps order of magnitude to fs due to the techniques of colliding mode-locking and pulse compressing. It challenges the routine method of intensity correlation curve( i. e. 3:1 curve). It is, of cause, interesting to find a new method for raising the precision of measurement of ultrashort pulse. Reference[ 1] measured the pulsewidth of 6 fs using the streak numbers of the interference correlation curve (i. e. 8:1 curve), and [ 2,3] presented a technique of equality-width.

Citation Download Citation

Zhenglie Gong "System with high resolution for measurement of ultrashort pulse", Proc. SPIE 1230, International Conference on Optoelectronic Science and Engineering '90, 12302G (1 July 1990); https://doi.org/10.1117/12.2294725

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available