A new method to laser-CCD scanning system applied to seamtracking

Shiwen Xu

doi:10.1117/12.2294753

1 July 1990 A new method to laser-CCD scanning system applied to seamtracking

Shiwen Xu

Proceedings Volume 1230, International Conference on Optoelectronic Science and Engineering '90; 123038 (1990) https://doi.org/10.1117/12.2294753
Event: The Marketplace for Industrial Lasers 1990, 1990, Chicago, IL, United States

Abstract

In this paper, it is described that a new method to laser-CCD scanning system is applied to seamtracking. Theoretically, the deviation of the seam position can be determinied by comparing their real-time position with their references. The experiments show that the method take the precision of 0. lmm horizontally, and 0. 5mm vertically.

Citation Download Citation

Shiwen Xu "A new method to laser-CCD scanning system applied to seamtracking", Proc. SPIE 1230, International Conference on Optoelectronic Science and Engineering '90, 123038 (1 July 1990); https://doi.org/10.1117/12.2294753

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