Paper
12 October 2022 DIRA: disjoint-identity resolution adaptation for low-resolution face recognition
Jacky Chen Long Chai, Cheng-Yaw Low, Andrew Beng Jin Teoh
Author Affiliations +
Proceedings Volume 12342, Fourteenth International Conference on Digital Image Processing (ICDIP 2022); 123420W (2022) https://doi.org/10.1117/12.2644258
Event: Fourteenth International Conference on Digital Image Processing (ICDIP 2022), 2022, Wuhan, China
Abstract
Low-resolution face recognition (LRFR) intends to identify unknown poor-quality face images and is widely employed in real-world surveillance applications. While collecting a large-scale labeled low-resolution (LR) face dataset could be conducive, it is practically infeasible due to labor costs and privacy issues. In contrast, accessing high-resolution (HR) face datasets is relatively effortless. However, prevailing domain adaptation techniques are often tenuous as they demand sharing of similar face images at different resolutions. We propose disjoint-identity resolution adaptation (DIRA) to transfer substantial face semantic representations from HR to LR face images, despite disjoint identities and limited labeled LR images. We accredit that continuous adversarial learning between HR-LR resolution alignment and segregation renders effective feature extraction and discriminative LR face representation. Our experimental results show a notable performance boost over the recent state-of-the-art methods for the challenging realistic low-resolution face recognition task.
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jacky Chen Long Chai, Cheng-Yaw Low, and Andrew Beng Jin Teoh "DIRA: disjoint-identity resolution adaptation for low-resolution face recognition", Proc. SPIE 12342, Fourteenth International Conference on Digital Image Processing (ICDIP 2022), 123420W (12 October 2022); https://doi.org/10.1117/12.2644258
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KEYWORDS
Facial recognition systems

Diffusion

Image resolution

Data modeling

Scanning probe lithography

Surveillance

Visualization

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