Paper
22 November 2022 Hidden defect detection based on metric learning
Ankang Liu, Lan Cheng, Yingchun Lv
Author Affiliations +
Proceedings Volume 12475, Second International Conference on Advanced Algorithms and Signal Image Processing (AASIP 2022); 124750M (2022) https://doi.org/10.1117/12.2659344
Event: Second International Conference on Advanced Algorithms and Signal Image Processing (AASIP 2022), 2022, Hulun Buir, China
Abstract
Aiming at the problems that hidden defects inside objects are difficult to be visually recognized and the defect samples obtained from inspection are few, a small-sample learning detection model using ultrasonic flaw detection to extend machine vision is proposed. The model introduces an attention mechanism into the deep nearest neighbor network to adjust the image features, so that the model pays more attention to the useful defect area features, increases the amount of defect-related information, and makes full use of key defect features to detect image targets. Experiments show that the proposed method has the best performance compared with the baseline model on the self-made hidden defect dataset, and the average correct rate is up to 83.85% under 10-shot; the model is tested with noisy images, and the results show that the model detection under noisy conditions has an accuracy rate of about 76%, and it has a certain anti-noise interference ability.
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ankang Liu, Lan Cheng, and Yingchun Lv "Hidden defect detection based on metric learning", Proc. SPIE 12475, Second International Conference on Advanced Algorithms and Signal Image Processing (AASIP 2022), 124750M (22 November 2022); https://doi.org/10.1117/12.2659344
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KEYWORDS
Signal detection

Defect detection

Ultrasonics

Data modeling

Performance modeling

Statistical modeling

Visual process modeling

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