Research on the influences of carrier deviation on digital moire interferometric technique

Zhan Tang; Yongqian Wu; Hong Wang

doi:10.1117/12.2653562

9 January 2023 Research on the influences of carrier deviation on digital moire interferometric technique

Zhan Tang, Yongqian Wu, Hong Wang

Proceedings Volume 12507, Advanced Optical Manufacturing Technologies and Applications 2022; and 2nd International Forum of Young Scientists on Advanced Optical Manufacturing (AOMTA and YSAOM 2022); 125070F (2023) https://doi.org/10.1117/12.2653562
Event: 2nd International Forum of Young Scientists on Advanced Optical Manufacturing (AOMTA and YSAOM 2022), 2022, Changchun, China

Abstract

Existing aspheric testing methods are sensitive to environmental effects. The digital moire interferometric technique (DMIT) demodulates surface errors from a single interferogram by building a virtual interferometer to avoid environmental effects. This method requires the actual carrier and the virtual carrier to be the same. In this paper, the effect of carrier deviation on DMIT is investigated. It was found that the carrier deviation would extend the spectrum of low-frequency information. Spectrum expansion can deteriorate the noise immunity of DMIT. Spectrum expansion may also lead to spectrum overlap. Method for determining the actual carrier from frequency domain is analyzed. A carrier alignment algorithm is proposed, and the simulation results deviate from the true value by only 6%.

Citation Download Citation

Zhan Tang, Yongqian Wu, and Hong Wang "Research on the influences of carrier deviation on digital moire interferometric technique", Proc. SPIE 12507, Advanced Optical Manufacturing Technologies and Applications 2022; and 2nd International Forum of Young Scientists on Advanced Optical Manufacturing (AOMTA and YSAOM 2022), 125070F (9 January 2023); https://doi.org/10.1117/12.2653562

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