Paper
7 August 2023 Two-dimensional LIV, spectrum, and beam characterization of individual emitters in a VCSEL array
Amir Sharghi, Frank Münchow, Arun Boddu, Thomas Limmer
Author Affiliations +
Abstract
LIV curves are fundamental measurement of laser diodes to determine electrical and optical operating characteristics. LIV curves consist of L-I curves (optical intensity against current) and V-I curves (voltage against current). LIV curves determine power conversion efficiency, threshold current, slope efficiency, kinks, rollover point and more. They are widely used at various stages since it is critical to identify failed DUTs early in the manufacturing process. LIV curves are always measured for the DUTs with single emitter or for DUT as a whole when consisting of many emitters. Detailed and comprehensive LIV test, spectrum and beam analysis of each single emitter of an array is the focus of this study. We extend existing one-dimensional LIV test, spectral and beam analysis (including beam numerical aperture, M2 and beam waist) to each single emitter of the laser diode array at well-controlled conditions. Our experimental design consists of camera based radiant power and spectrum measurement. This approach allows parallelization of the measurements, which reduces overall measurement time, and investigation on the cross-talk between individual emitters. We analyzed electrical, optical and spectral differences within emitters of a VCSEL array and as well with the array as a whole. The accepted range of variation can be set in order to identify underperforming or out-of-specification single emitters. Therefore, defect or deficient laser diodes are detected at early stages of the manufacturing process, saving time and money. Such comprehensive characterization of individual emitters is crucial for demanding applications such as facial recognition, 3D sensing, in cabin sensing, LiDAR and ranging.
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Amir Sharghi, Frank Münchow, Arun Boddu, and Thomas Limmer "Two-dimensional LIV, spectrum, and beam characterization of individual emitters in a VCSEL array", Proc. SPIE 12624, Digital Optical Technologies 2023, 1262414 (7 August 2023); https://doi.org/10.1117/12.2679760
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KEYWORDS
Vertical cavity surface emitting lasers

Semiconductor lasers

Near field optics

Optics manufacturing

Manufacturing

LIDAR

Near field

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