Paper
20 June 2023 A detection system and device for main variable temperature controller based on cloud platform
Author Affiliations +
Proceedings Volume 12715, Eighth International Conference on Electronic Technology and Information Science (ICETIS 2023); 1271519 (2023) https://doi.org/10.1117/12.2682390
Event: Eighth International Conference on Electronic Technology and Information Science (ICETIS 2023), 2023, Dalian, China
Abstract
The main variable temperature controller has not achieved an automatic testing function so far, which consumes great labor and capital costs. The innovation of this paper is to achieve fully automatic and intelligent detection of the main variable temperature controller. We construct an intelligent testing equipment remote control system, including a remote monitoring and management system for testing equipment backstage, a mobile APP for testing equipment, an APP for receiving terminals, and an application service for the testing report interface, which realizes the function of remote management and viewing of reports. A fully automatic calibration device for the main substation thermostat is designed, including the inspected thermostat, constant temperature oil tank, calibrator, and graphic conversion device, which realizes the device to automatically complete the testing of substation-related devices. By designing the communication serial port of the device and developing the corresponding device on the cloud, the software and hardware are well integrated. The technical solution promotes the turnover rate and utilization rate of testing equipment and enhances the comprehensive management capability of testing equipment.
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Guiliang Li, Jinhui Yan, Xinyuan Luo, Yongsheng Luo, Yousong Ren, and Chengjiang Zhou "A detection system and device for main variable temperature controller based on cloud platform", Proc. SPIE 12715, Eighth International Conference on Electronic Technology and Information Science (ICETIS 2023), 1271519 (20 June 2023); https://doi.org/10.1117/12.2682390
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KEYWORDS
Temperature metrology

Clouds

Inspection

Calibration

Control systems

Inspection equipment

Temperature control

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