Paper
17 August 2023 A path planning method for large-aperture non-spherical surface detection profilometer
Tingyu Wang, Zhiyi Wang, Jianli Wang
Author Affiliations +
Proceedings Volume 12757, 3rd International Conference on Laser, Optics, and Optoelectronic Technology (LOPET 2023); 127572Y (2023) https://doi.org/10.1117/12.2690162
Event: 3rd International Conference on Laser, Optics and Optoelectronic Technology (LOPET 2023), 2023, Kunming, China
Abstract
To enhance the accuracy, efficiency, and safety of large-aperture non-spherical optical components, we have proposed a novel strategy for path planning and detection, which uses a non-contact optical probe suitable for spindle-rotating contourimeters. Our strategy leverages the contourimeter's working principle and the structural characteristics of the surface, transforming the three-dimensional collision problem into a two-dimensional detection space. To accomplish this, we first decompose the cross-section of the workpiece into a quadtree space and establish oriented bounding boxes for each sub-node. We then use the separation axis principle to ensure motion safety between the positions of the test points. Next, we utilize the ant colony optimization algorithm to plan the detection path and generate an interference-free scanning route that ensures safety during the detection process. Overall, our path-planning strategy significantly improves detection efficiency, while ensuring that the detection process is conducted safely. By combining these methods, we created a robust and effective approach to detecting large-aperture non-spherical optical components.
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tingyu Wang, Zhiyi Wang, and Jianli Wang "A path planning method for large-aperture non-spherical surface detection profilometer", Proc. SPIE 12757, 3rd International Conference on Laser, Optics, and Optoelectronic Technology (LOPET 2023), 127572Y (17 August 2023); https://doi.org/10.1117/12.2690162
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KEYWORDS
Detection and tracking algorithms

Inspection

Profilometers

Safety

Sensors

Confocal microscopy

Optical surfaces

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