Research on functional safety testability of vehicle gauge chip

Wei Guo; Xiyang Wang; Wenxia Xi

doi:10.1117/12.3007123

25 October 2023 Research on functional safety testability of vehicle gauge chip

Wei Guo, Xiyang Wang, Wenxia Xi

Proceedings Volume 12801, Ninth International Conference on Mechanical Engineering, Materials, and Automation Technology (MMEAT 2023); 128014X (2023) https://doi.org/10.1117/12.3007123
Event: Ninth International Conference on Mechanical Engineering, Materials, and Automation Technology (MMEAT 2023), 2023, Dalian, China

Abstract

Gauge chips are increasingly widely used in modern automobiles. They assume the important tasks of controlling and managing various key functions. However, in order to ensure the safety and reliability of vehicle performance, the functional safety and testability of vehicle gauge chip become an indispensable research direction. This paper focuses on the functional safety and testability of vehicle gauge chips in order to provide an in-depth understanding of this field. By further studying the functional safety and testability of vehicle gauge chips, we can further improve the safety and performance reliability of vehicles and contribute to the development of intelligent transportation systems in the future.

(2023) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Wei Guo, Xiyang Wang, and Wenxia Xi "Research on functional safety testability of vehicle gauge chip", Proc. SPIE 12801, Ninth International Conference on Mechanical Engineering, Materials, and Automation Technology (MMEAT 2023), 128014X (25 October 2023); https://doi.org/10.1117/12.3007123

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