C-axis determination of a uniaxial crystal with high-repeatability common-path heterodyne retardation measurement

Naoaki Kato; Yu Takiguchi; Kazuhiro Nakamura; Hiroshi Tanaka

doi:10.1117/12.2691996

11 March 2024 C-axis determination of a uniaxial crystal with high-repeatability common-path heterodyne retardation measurement

Naoaki Kato, Yu Takiguchi, Kazuhiro Nakamura, Hiroshi Tanaka

Author Affiliations +

Proceedings Volume 12893, Photonic Instrumentation Engineering XI; 1289306 (2024) https://doi.org/10.1117/12.2691996
Event: SPIE OPTO, 2024, San Francisco, California, United States

Abstract

We developed an ultra-precise retardation-measurement system based on optical-heterodyne interferometry with a 3σ repeatability of λ/360, 000 for zero retardation, where the frequency shift for the optical-heterodyne interferometry was generated by a rotating half-waveplate, and both polarizations for the retardation measurement were always exactly on a common path. Using this system, the direction of the c-axis of a sapphire window was determined by analyzing the incidence-angle dependence of the retardation. The possible resolution of the c-axis direction of the sapphire window was estimated to be 0.9 arcmin from the retardation-measurement repeatability. This c-axis determination method will be applicable to, for example, high-precision sapphire-mirror production/evaluation for gravitational-wave detection.

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(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Naoaki Kato, Yu Takiguchi, Kazuhiro Nakamura, and Hiroshi Tanaka "C-axis determination of a uniaxial crystal with high-repeatability common-path heterodyne retardation measurement", Proc. SPIE 12893, Photonic Instrumentation Engineering XI, 1289306 (11 March 2024); https://doi.org/10.1117/12.2691996

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