Potential roughness suppression in a RF AC Zeeman atom chip trap

William Miyahira; Seth Aubin

doi:10.1117/12.3012372

13 March 2024 Potential roughness suppression in a RF AC Zeeman atom chip trap

William Miyahira, Seth Aubin

Proceedings Volume 12912, Quantum Sensing, Imaging, and Precision Metrology II; 129120X (2024) https://doi.org/10.1117/12.3012372
Event: SPIE Quantum West, 2024, San Francisco, California, United States

Abstract

Trapping and manipulating ultracold atoms through the use of atom chips offers the ability to engineer complex electromagnetic field geometries in a compact form factor. One of the primary limitations hindering their use is trap potential roughness which arises as a result of defects in the atom chip wires when atoms are brought close to the chip. This roughness can play a limiting role in atom interferometry and strong 1D confinement experiments. We present an initial experimental demonstration of atom chip potential roughness suppression using radio-frequency (RF) AC Zeeman (ACZ) potentials on an atom chip. Using ∼20 MHz RF magnetic near-fields from the chip to target intra-manifold transitions in the ⁸⁷Rb ground state, we trap atoms in a spindependent ACZ potential. We compare the axial trapping potential for atoms in comparable 2-wire DC and AC Zeeman traps and show evidence of roughness suppression in the AC trap.

Conference Presentation

Citation Download Citation

William Miyahira and Seth Aubin "Potential roughness suppression in a RF AC Zeeman atom chip trap", Proc. SPIE 12912, Quantum Sensing, Imaging, and Precision Metrology II, 129120X (13 March 2024); https://doi.org/10.1117/12.3012372

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