Paper
6 November 2023 Study and verification of infrared micro scanning super resolution
Yanyan Liu Sr., Shiwei Xu, Yuping Du, Kuaikuai Yu, Yuhai Li
Author Affiliations +
Proceedings Volume 12921, Third International Computing Imaging Conference (CITA 2023); 129213E (2023) https://doi.org/10.1117/12.2691561
Event: Third International Computing Imaging Conference (CITA 2023), 2023, Sydney, Australia
Abstract
This article provides theoretical derivation of the mathematical model of an infrared imaging system, and research shows that changing the sampling process of the detector can improve the MTF of the system. Theoretical simulation analysis showed that the use of micro scanning technology can improve the MTF of the system, and finally, the super-resolution ability of cc scanning technology was verified through experiments. The results indicate that the MTF of the system can be improved through micro scanning technology, and the main factors affecting the improvement of MTF include the pixel size of the detector, fill rate, micro scanning method and so on. When designing the system, different scanning methods can be set according to requirements to achieve super-resolution effects.
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yanyan Liu Sr., Shiwei Xu, Yuping Du, Kuaikuai Yu, and Yuhai Li "Study and verification of infrared micro scanning super resolution", Proc. SPIE 12921, Third International Computing Imaging Conference (CITA 2023), 129213E (6 November 2023); https://doi.org/10.1117/12.2691561
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Super resolution

Image processing

Imaging systems

Modulation transfer functions

Infrared imaging

Infrared radiation

Image resolution

Back to Top