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4 March 2024 Research on health status evaluation method for DC motor drive circuits under multiple failure mechanisms
Jun Jiang, Long Yan, Xiao Rui Zong
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Proceedings Volume 12981, Ninth International Symposium on Sensors, Mechatronics, and Automation System (ISSMAS 2023); 129813K (2024) https://doi.org/10.1117/12.3014815
Event: 9th International Symposium on Sensors, Mechatronics, and Automation (ISSMAS 2023), 2023, Nanjing, China
Abstract
Motor drive circuits have been widely used in various fields in recent years, but there is no mature method for online evaluation of their health status under multiple failure mechanisms. By analyzing the common DC motor drive circuit, this paper selects the key devices and key parameters that can characterize the remaining life of the drive circuit. Using existing experimental data of device reliability, the remaining life prediction algorithm is constructed. The measured data are mapped into the typical failure model by gradient descent and similarity analysis method, so as to predict the remaining life of the driving circuit in the current operating environment, and then evaluate the health status of the circuit. Finally, the Δ Rds (on) parameter of MOSFET was selected as the feature parameter, and the algorithm was simulated and validated using existing data.
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
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Jun Jiang, Long Yan, and Xiao Rui Zong "Research on health status evaluation method for DC motor drive circuits under multiple failure mechanisms", Proc. SPIE 12981, Ninth International Symposium on Sensors, Mechatronics, and Automation System (ISSMAS 2023), 129813K (4 March 2024); https://doi.org/10.1117/12.3014815
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KEYWORDS
Failure analysis
Data modeling
Field effect transistors
Circuit switching
Reliability
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