Temperature coefficient of refractive index for candidate optical windows

Charles H. Lange; Donald Dean Duncan

doi:10.1117/12.22483

1 October 1990 Temperature coefficient of refractive index for candidate optical windows

Proceedings Volume 1326, Window and Dome Technologies and Materials II; (1990) https://doi.org/10.1117/12.22483
Event: 34th Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1990, San Diego, CA, United States

Abstract

The temperature coefficients of refractive index for various crystalline and polycrystalline materials, Al203 (ordinary ray), Y203, LaO3-dOped Y203, ALON, and MgA12O4 were determined from measurements of optical thickness as a function of temperature using a Michelson interferometer operating at 0.633 pm. For the temperature range of 23°C to 500°C, the first order coefficients ranged from 8.28x10I0C for pure yttria to 14.6x10/°C for ALON. Measurements of NaC1 and A1203 samples using this technique are in agreement with published data.

Citation Download Citation

Charles H. Lange and Donald Dean Duncan "Temperature coefficient of refractive index for candidate optical windows", Proc. SPIE 1326, Window and Dome Technologies and Materials II, (1 October 1990); https://doi.org/10.1117/12.22483

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