Paper
1 July 1991 Origins of asymmetry in spin-cast films over topography
Loni M. Manske, David B. Graves
Author Affiliations +
Abstract
A pulsed laser, a microscope, and a 35-mm camera are used to stroboscopically create and image interference fringes around surface features during spin coating. The measured film thickness profiles are compared to predictions from a lubrication model. This model has been extended to two dimensions so that the surface contours around features of any width and length may be calculated, and preliminary results are reported. Profile asymmetry, or 'pile- up,' is caused by surface tension forces near the edges of the feature that accelerate flow where the channel (the film thickness) narrows and retard flow where the film thickness widens.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Loni M. Manske and David B. Graves "Origins of asymmetry in spin-cast films over topography", Proc. SPIE 1463, Optical/Laser Microlithography IV, (1 July 1991); https://doi.org/10.1117/12.44800
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CITATIONS
Cited by 5 scholarly publications.
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KEYWORDS
Capillaries

Semiconducting wafers

Coating

Microfluidics

Optical lithography

Solids

Interferometry

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