Infrared/microwave correlation measurements

John D. Norgard; Don W. Metzger; John C. Cleary; Michael F. Seifert

doi:10.1117/12.48776

1 December 1991 Infrared/microwave correlation measurements

John D. Norgard, Don W. Metzger, John C. Cleary, Michael F. Seifert

Proceedings Volume 1540, Infrared Technology XVII; (1991) https://doi.org/10.1117/12.48776
Event: San Diego, '91, 1991, San Diego, CA, United States

Abstract

An infrared (IR) measurement technique for determining two-dimensional (2-D) and three- dimensional (3-D) microwave field distributions is presented. This IR technique is used to verify predictions made by various numerical electromagnetic (EM) codes. The experimental technique is based on IR thermal measurements of the Joule heating induced in a lossy dielectric or resistive material used as a calibrated IR detection screen when microwave energy is absorbed by the screen. An IR scanning system records the thermal radiation from the screen. The intensity of the microwave field is related to variations in the surface temperature distribution. The detection screen material is of a thin, planar construction and, thus, produces a 2-D map of the microwave field. By moving the screen along the normal to its plane, samples of the 3-D field are obtained. This experimental approach has been applied to several 2-D and 3-D scattering and coupling problems. Comparisons are made between the theoretical and experimental results for various hollow slit cylinder configurations. The advantages, disadvantages and limitations of this IR thermal technique for validation of EM theoretical predictions are discussed.

Citation Download Citation

John D. Norgard, Don W. Metzger, John C. Cleary, and Michael F. Seifert "Infrared/microwave correlation measurements", Proc. SPIE 1540, Infrared Technology XVII, (1 December 1991); https://doi.org/10.1117/12.48776

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