Circular intensity differential scattering measurements in the soft x-ray region of the spectrum (~16 EV to 500 EV)

Marcos F. Maestre; Carlos J. Bustamante; Patricia Ann Snyder; Ednor M. Rowe; Roger W.C. Hansen

doi:10.1117/12.50583

1 November 1991 Circular intensity differential scattering measurements in the soft x-ray region of the spectrum (~16 EV to 500 EV)

Marcos F. Maestre, Carlos J. Bustamante, Patricia Ann Snyder, Ednor M. Rowe, Roger W.C. Hansen

Author Affiliations +

Proceedings Volume 1548, Production and Analysis of Polarized X Rays; (1991) https://doi.org/10.1117/12.50583
Event: San Diego, '91, 1991, San Diego, CA, United States

Abstract

We propose the use of recently developed technique of circular intensity differential scattering (CIDS), as extended to the soft x-ray region of the spectrum (16 eV to 500 eV), to study the higher order organization of the eukaryotic chromosome. CIDS is the difference in scattering power of an object when illuminated by right circularly polarized vs. left circularly polarized electromagnetic radiation of arbitrary wavelength. CIDS has been shown to be a very sensitive measure of the helical organization of the scattering object, e.g., the eukaryotic chromosome. Preliminary results of measurements of samples of bacteriophages and octopus sperm done at SRC, Wisconsin, show the technique to be very sensitive to the dimensional parameters of the particles interrogated by circularly polarized light.

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Marcos F. Maestre, Carlos J. Bustamante, Patricia Ann Snyder, Ednor M. Rowe, and Roger W.C. Hansen "Circular intensity differential scattering measurements in the soft x-ray region of the spectrum (~16 EV to 500 EV)", Proc. SPIE 1548, Production and Analysis of Polarized X Rays, (1 November 1991); https://doi.org/10.1117/12.50583

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