Measurement of residual stresses in plastic materials by electronic shearography

Kahwah Long; Y.Y. Hung; Joseph Der Hovanesian

doi:10.1117/12.49485

1 December 1991 Measurement of residual stresses in plastic materials by electronic shearography

Kahwah Long, Y.Y. Hung, Joseph Der Hovanesian

Proceedings Volume 1554, Second International Conference on Photomechanics and Speckle Metrology; (1991) https://doi.org/10.1117/12.49485
Event: San Diego, '91, 1991, San Diego, CA, United States

Abstract

This paper presents a method for measuring residual stresses in plastic materials. The approach is based on measuring the out-of-plane displacement caused by a blind hole drilled on the surface of the test object. The out-of-plane displacement is measured by electronic shearography at video camera speed and hence the results are obtained almost in real-time. Unlike holography, electronic shearography does not require special vibration isolation nor ambient light dependence. These advantageous features make the method practical for qualitative analysis of residual stresses in a production/field environment.

Citation Download Citation

Kahwah Long, Y.Y. Hung, and Joseph Der Hovanesian "Measurement of residual stresses in plastic materials by electronic shearography", Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, (1 December 1991); https://doi.org/10.1117/12.49485

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