Paper
1 December 1991 Quantitative analysis of contact deformation using holographic interferometry and speckle photography
Jin W. Joo, Young Ha Kwon, Seung Ok Park
Author Affiliations +
Abstract
The optical technique combined the holographic interferometry and speckle photography was applied to measure three dimensional deformation. Out-of-plane and in-plane displacements of the contact deformation were determined experimentally and compared with the numerical analysis. The experimental results are in good agreement with the numerical results.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jin W. Joo, Young Ha Kwon, and Seung Ok Park "Quantitative analysis of contact deformation using holographic interferometry and speckle photography", Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, (1 December 1991); https://doi.org/10.1117/12.57479
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KEYWORDS
Fringe analysis

Photography

Holographic interferometry

Speckle

Finite element methods

Holography

3D metrology

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