Paper
14 December 1992 Silicon for use as a transmissive material in the far IR
Charles R. Poznich, Jroy C. Richter
Author Affiliations +
Abstract
Silicon is used extensively as a transmissive optic in the mid infrared (IR) region of the spectrum. It has not been used in the far IR primarily due to an absorption band at about nine microns. This absorption is the result of both intrinsic lattice absorption and an impurity band absorption due to oxygen (O2). The absorption can be minimized by reducing or eliminating the impurity band component. In this work we report results obtained from transmission scans for low oxygen 'O2 Free' silicon. We compare these results with those obtained for typical Czochralski (CZ) silicon. Absorption coefficients are calculated from the transmission data. Tabular data and graphical representations of the data are shown in the eight to twelve micron region of the spectrum.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Charles R. Poznich and Jroy C. Richter "Silicon for use as a transmissive material in the far IR", Proc. SPIE 1760, Window and Dome Technologies and Materials III, (14 December 1992); https://doi.org/10.1117/12.130792
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Cited by 4 scholarly publications.
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KEYWORDS
Silicon

Absorption

Oxygen

Far infrared

Polishing

FT-IR spectroscopy

Thermography

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