Analysis of STEM images on a RISC workstation with an APL interface

Oscar H. Kapp; Shengyang Ruan

doi:10.1117/12.130967

1 August 1992 Analysis of STEM images on a RISC workstation with an APL interface

Oscar H. Kapp, Shengyang Ruan

Proceedings Volume 1778, Imaging Technologies and Applications; (1992) https://doi.org/10.1117/12.130967
Event: Optical Engineering Midwest 1992, 1992, Chicago, IL, United States

Abstract

We have developed a stand-alone image processing system with an interface to an APL interpreter on a second generation RISC workstation to analyze digital images from our scanning transmission electron microscopes (STEM). The system is UNIX based and utilizes the X-Windows system to display images and to toggle between different environments.

Citation Download Citation

Oscar H. Kapp and Shengyang Ruan "Analysis of STEM images on a RISC workstation with an APL interface", Proc. SPIE 1778, Imaging Technologies and Applications, (1 August 1992); https://doi.org/10.1117/12.130967

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available