Industrial potential of Rayleigh scattered x rays for identification of low-Z materials

Russell D. Luggar; Walter B. Gilboy; N. MacCuaig

doi:10.1117/12.171257

28 March 1994 Industrial potential of Rayleigh scattered x rays for identification of low-Z materials

Russell D. Luggar, Walter B. Gilboy, N. MacCuaig

Proceedings Volume 2092, Substance Detection Systems; (1994) https://doi.org/10.1117/12.171257
Event: Substance Identification Technologies, 1993, Innsbruck, Austria

Abstract

An investigation is being carried out into the potential use of elastic (or Rayleigh) scattered photons for the rapid identification of low atomic number materials. This technique has applications in the food industry for on-line quality control as well as areas such as security screening, materials recycling, and possible medical diagnostics.

Citation Download Citation

Russell D. Luggar, Walter B. Gilboy, and N. MacCuaig "Industrial potential of Rayleigh scattered x rays for identification of low-Z materials", Proc. SPIE 2092, Substance Detection Systems, (28 March 1994); https://doi.org/10.1117/12.171257

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