Paper
6 May 1994 High-field electron transport in GaAs: a picosecond time-resolved Raman probe
Eric D. Grann, Shou Jong Sheih, C. Chia, Kong-Thon F. Tsen, Otto F. Sankey, George N. Maracas, R. Droopad, Arnel A. Salvador, Andrei Botchkarev, Hadis Morkoc
Author Affiliations +
Proceedings Volume 2142, Ultrafast Phenomena in Semiconductors; (1994) https://doi.org/10.1117/12.175890
Event: OE/LASE '94, 1994, Los Angeles, CA, United States
Abstract
Electric-field-induced non-equilibrium carrier distributions in GaAs-based p-i-n nanostructure semiconductors has been studied by transient Raman spectroscopy on a picosecond time scale and at T approximately equals 80 K. For an injected carrier density of n approximately equals 2.2 X 1018 cm-3 and electric field intensity E equals 25 KV/cm, the drift velocity of electrons as high as Vd equals 2.5 X 107 cm/sec was observed. We demonstrate in this work that time-resolved Raman spectroscopy is a feasible technique to interrogate both ballistic transport and velocity overshoot phenomena in nanostructure semiconductors.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Eric D. Grann, Shou Jong Sheih, C. Chia, Kong-Thon F. Tsen, Otto F. Sankey, George N. Maracas, R. Droopad, Arnel A. Salvador, Andrei Botchkarev, and Hadis Morkoc "High-field electron transport in GaAs: a picosecond time-resolved Raman probe", Proc. SPIE 2142, Ultrafast Phenomena in Semiconductors, (6 May 1994); https://doi.org/10.1117/12.175890
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Gallium arsenide

Raman spectroscopy

Surface plasmons

Electron transport

Raman scattering

Picosecond phenomena

Scattering

Back to Top