Paper
1 May 1994 Emission and arc studies of contacts with metal-oxide inclusions
A. M. Chaly, Victor A. Nevrovsky
Author Affiliations +
Proceedings Volume 2259, XVI International Symposium on Discharges and Electrical Insulation in Vacuum; (1994) https://doi.org/10.1117/12.174617
Event: XVI International Symposium on Discharges and Electrical Insulation in Vacuum, 1994, Moscow-St. Petersburg, Russian Federation
Abstract
This paper reports studies of contact admixtures effects on recovery voltages of contact pairs when admixtures have a form of multiple inclusions of some metal oxides introduced into standard contact material CuCr 50/50. The breakdown and recovery voltage studies of these materials were carried out at a simulating circuit with load current up to 300 A and frequencies 50 kHz - 120 kHz. Grains of alumina, and hafnium, lithium and lanthan oxides were used as inclusions. CuCr 50/50 with small tungsten chips was used as reference material. Statistical characteristics of recovery voltages were obtained for these materials and some promising compositions were selected for future studies.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. M. Chaly and Victor A. Nevrovsky "Emission and arc studies of contacts with metal-oxide inclusions", Proc. SPIE 2259, XVI International Symposium on Discharges and Electrical Insulation in Vacuum, (1 May 1994); https://doi.org/10.1117/12.174617
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KEYWORDS
Oxides

Lithium

Electrodes

Device simulation

Chromium

Copper

Inductance

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