Validation of an IR seeker/sensor performance model

Jason S. Holloway; Steven P. Auerbach; Richard D. Brewer; Lawrence E. Hauser; John D. McGlynn; Jeffrey V. Richard; Teresa Seward

doi:10.1117/12.210040

22 May 1995 Validation of an IR seeker/sensor performance model

Jason S. Holloway, Steven P. Auerbach, Richard D. Brewer, Lawrence E. Hauser, John D. McGlynn, Jeffrey V. Richard, Teresa Seward

Author Affiliations +

Proceedings Volume 2470, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing VI; (1995) https://doi.org/10.1117/12.210040
Event: SPIE's 1995 Symposium on OE/Aerospace Sensing and Dual Use Photonics, 1995, Orlando, FL, United States

Abstract

This paper describes the validation of an end-to-end IR seeker/sensor dynamic performance model. The model was developed to perform system level trades and design analyses for IR missile seeker/sensor design, and its structural framework was patterned after the physical flow of information through a user specified electro-optical system and missile engagement scenario. The validation methodology was based upon comparisons of performance model predictions of signal-to-interference ratio (SIR) relative to the performance measurements of a baseline algorithm stream, which processed actual dual-band IR imagery, emulating an actual seeker and processor. This metric was chosen for the validation study, since this is the critical parameter determining missile seeker acquisition range and tracking fidelity. In the validation study, over 15,000 SIR comparisons were made, as a function of various critical system parameters, including registration accuracy and fixed pattern noise level. On average the performance model predictions of SIR matched those of the baseline algorithm stream within 3 decibels (dB).

Citation Download Citation

Jason S. Holloway, Steven P. Auerbach, Richard D. Brewer, Lawrence E. Hauser, John D. McGlynn, Jeffrey V. Richard, and Teresa Seward "Validation of an IR seeker/sensor performance model", Proc. SPIE 2470, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing VI, (22 May 1995); https://doi.org/10.1117/12.210040

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