Critical length of disorder for the onset of localization in YBa2Cu3O6.9 films

Andrea Gauzzi; B. Johan Joensson; Arnaud Clerc-Dubois; Davor Pavuna

doi:10.1117/12.250275

5 July 1996 Critical length of disorder for the onset of localization in YBa₂Cu₃O_6.9films

Andrea Gauzzi, B. Johan Joensson, Arnaud Clerc-Dubois, Davor Pavuna

Proceedings Volume 2697, Oxide Superconductor Physics and Nano-Engineering II; (1996) https://doi.org/10.1117/12.250275
Event: Photonics West '96, 1996, San Jose, CA, United States

Abstract

We report a combined analysis of resistivity and x-ray diffraction rocking curve measurements on c-axis oriented YBA₂Cu₃O_6.9 films epitaxially grown on (100) SrTiO₃ and LaAlO₃ by ion-beam sputtering. We find that the growth-induced reduction of long-range lattice order in the films begins to depress superconductivity and normal conductivity at a critical value of lattice coherence length of approximately equals 10 and 5 nm for the two above types of substrates respectively. Evidence for disorder-induced localization is given by a deviation from linearity of the temperature-dependence of the resistivity which scales as the reduction of superconducting critical temperature. Similar nonlinear dependence observed in slightly reduced or lightly Co-doped samples suggests that the disorder in our films significantly affects the CuO chains. Our analysis of the paraconductivity term in the films gives evidence for the enhancement of the superconducting fluctuations by the disorder.

Citation Download Citation

Andrea Gauzzi, B. Johan Joensson, Arnaud Clerc-Dubois, and Davor Pavuna "Critical length of disorder for the onset of localization in YBa₂Cu₃O_6.9films", Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, (5 July 1996); https://doi.org/10.1117/12.250275

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