Reflection mode scanning near-field optical microscope (SNOM) with the tetrahedral tip

J. Ferber; U. C. Fischer; J. Koglin; Harald Fuchs

doi:10.1117/12.250781

18 September 1996 Reflection mode scanning near-field optical microscope (SNOM) with the tetrahedral tip

J. Ferber, U. C. Fischer, J. Koglin, Harald Fuchs

Proceedings Volume 2782, Optical Inspection and Micromeasurements; (1996) https://doi.org/10.1117/12.250781
Event: Lasers, Optics, and Vision for Productivity in Manufacturing I, 1996, Besancon, France

Abstract

We present first results with a reflection mode SNOM, which uses a tetrahedral tip as an apertureless near-field probe. The SNOM was driven together with an STM to control the tip- surface distance in order to avoid mechanical damage of the tip.

Citation Download Citation

J. Ferber, U. C. Fischer, J. Koglin, and Harald Fuchs "Reflection mode scanning near-field optical microscope (SNOM) with the tetrahedral tip", Proc. SPIE 2782, Optical Inspection and Micromeasurements, (18 September 1996); https://doi.org/10.1117/12.250781

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