Automatic defect detection

Guylaine Daillant; Dominique Micollet; Michel Paindavoine

doi:10.1117/12.248533

26 August 1996 Automatic defect detection

Guylaine Daillant, Dominique Micollet, Michel Paindavoine

Proceedings Volume 2785, Vision Systems: New Image Processing Techniques; (1996) https://doi.org/10.1117/12.248533
Event: Lasers, Optics, and Vision for Productivity in Manufacturing I, 1996, Besancon, France

Abstract

We propose in this article a complete acquisition and processing line of weld radiographies, from which must be highlighted cavity shaped defects. The main features of the films are a high optical density, a strong inhomogeneous background in both directions and a weak contrast. We present the study of three trend removal methods (least square fitting, Fourier smoothing and adjustment splines) allowing to improve the signal/noise ratio of the edges pictures. The segmentation is derived from the edges picture by the mean of a constrained watershed algorithm. The constraints are deduced in an automatic way from the shape of the histogram.

Citation Download Citation

Guylaine Daillant, Dominique Micollet, and Michel Paindavoine "Automatic defect detection", Proc. SPIE 2785, Vision Systems: New Image Processing Techniques, (26 August 1996); https://doi.org/10.1117/12.248533

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available