Built-in self-test for high-speed integrated circuits

Udo Jorczyk; Wilfried Daehn

doi:10.1117/12.250824

12 September 1996 Built-in self-test for high-speed integrated circuits

Udo Jorczyk, Wilfried Daehn

Proceedings Volume 2874, Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II; (1996) https://doi.org/10.1117/12.250824
Event: Microelectronic Manufacturing 1996, 1996, Austin, TX, United States

Abstract

The paper deals with testability analysis of differential ECL. The logic behavior and the drop in performance concerning a very detailed list of possible bipolar defects are examined. It is shown that at speed testing facilitates a rather high fault coverage of about 98% and that it is strictly necessary to test high speed integrated circuits at speed using BIST because automatic test equipment is only available up to clock frequencies of 660 MHz. The paper also deals with the design of high speed integrated circuits for test applications using differential ECL (emitter coupled logic). High operating speed can only be achieved if suitable circuit concepts (full custom designs) are chosen and the circuits themselves are carefully optimized. Circuits have been designed considering a low power consumption and a small overhead as they are used for testpattern generation (TPG) and signature analysis (SA) within a built-in self-test (BIST)-architecture. TPG and SA at datarates of several Gbit/s using LFSRs (linear feedback shift registers) are investigated.

Citation Download Citation

Udo Jorczyk and Wilfried Daehn "Built-in self-test for high-speed integrated circuits", Proc. SPIE 2874, Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II, (12 September 1996); https://doi.org/10.1117/12.250824

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available