Residual stress characterization of welds and post-weld processes using x-ray diffraction techniques

Michael E. Brauss; James A. Pineault; John S. Eckersley

doi:10.1117/12.302553

15 March 1998 Residual stress characterization of welds and post-weld processes using x-ray diffraction techniques

Michael E. Brauss, James A. Pineault, John S. Eckersley

Proceedings Volume 3399, Process Control and Sensors for Manufacturing; (1998) https://doi.org/10.1117/12.302553
Event: Non-Destructive Evaluation Techniques for Aging Infrastructure and Manufacturing, 1998, San Antonio, TX, United States

Abstract

This paper illustrates the importance of residual stress characterization in welds and post weld processes. The failure to characterize residual stresses created during welding and/or post weld processes can lead to unexpected occurrences of stress corrosion cracking, distortion, fatigue cracking as well as instances of over design or over processing. The development of automated residual stress mapping and the availability of portable and fast equipment have now made the characterization of residual stresses using x-ray diffraction practical for process control and optimization. The paper presents examples where x-ray diffraction residual stress characterization techniques were applied on various kinds of welds including arc welds, TIG welds, resistance welds, laser welds and electron beam welds. The nondestructive nature of the x-ray diffraction technique has made the residual stress characterization of welds a useful tool for process optimization and failure analysis, particularly since components can be measured before and after welding and post welding processes. Some examples presented show the residual stresses before and after the application of post weld processes such as shot peening, grinding and heat treatment.

Citation Download Citation

Michael E. Brauss, James A. Pineault, and John S. Eckersley "Residual stress characterization of welds and post-weld processes using x-ray diffraction techniques", Proc. SPIE 3399, Process Control and Sensors for Manufacturing, (15 March 1998); https://doi.org/10.1117/12.302553

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