Paper
7 April 1999 Laser modulated scattering as a nondestructive evaluation tool for optical surfaces and thin film coatings
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Abstract
Laser modulated scattering (LMS) is introduced as a non- destruction evaluation tool for defect inspection and characterization of optical surface sand thin film coatings. It allows simultaneous measurement of the DC and AC scattering signals of a probe laser beam from an optical surface. by comparison between the DC and AC scattering signals, one can differentiate absorptive defects from non- absorptive ones. This paper describes the principle of the LMS technique and the experimental setup, and illustrates examples on using LMS as a tool for nondestructive evaluation of high quality optics.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zhouling Wu, Michael D. Feit, Mark R. Kozlowski, Alexander M. Rubenchik, and Lynn Matthew Sheehan "Laser modulated scattering as a nondestructive evaluation tool for optical surfaces and thin film coatings", Proc. SPIE 3578, Laser-Induced Damage in Optical Materials: 1998, (7 April 1999); https://doi.org/10.1117/12.344422
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Cited by 1 scholarly publication and 1 patent.
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KEYWORDS
Laser scattering

Scattering

Laser beam diagnostics

Absorption

Laser induced damage

Modulation

Nondestructive evaluation

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