Portable holographic interferometer for residual stress measurement and nondestructive testing (NDT) of pipelines

Yuriy Onishchenko; Anatoli Kniazkov; Jon Shulz; Gregory J. Salamo

doi:10.1117/12.339937

5 February 1999 Portable holographic interferometer for residual stress measurement and nondestructive testing (NDT) of pipelines

Yuriy Onishchenko, Anatoli Kniazkov, Jon Shulz, Gregory J. Salamo

Author Affiliations +

Proceedings Volume 3588, Nondestructive Evaluation of Utilities and Pipelines III; (1999) https://doi.org/10.1117/12.339937
Event: Nondestructive Evaluation Techniques for Aging Infrastructures and Manufacturing, 1999, Newport Beach, CA, United States

Abstract

Introducing a small scratch (10 - 25 (mu) depth) on the surface of a part containing residual stresses produces a small change in displacements around of the scratch on the surface. When the displacements are measured as a function of the depth of a scratch, a very small depth releases displacements of about (lambda) /10. The present paper shows that introduction of an additional faze shift permits determination of very small displacements and also presents the portable interferometer and the technique for measurement of residual stress in field conditions.

Citation Download Citation

Yuriy Onishchenko, Anatoli Kniazkov, Jon Shulz, and Gregory J. Salamo "Portable holographic interferometer for residual stress measurement and nondestructive testing (NDT) of pipelines", Proc. SPIE 3588, Nondestructive Evaluation of Utilities and Pipelines III, (5 February 1999); https://doi.org/10.1117/12.339937

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