Paper
28 May 1999 3D-imaging laser scanner for close-range metrology
Aloysius Wehr
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Abstract
This paper presents a 3D-Imaging Laser Scanner (3D-ILS) for close range survey for up to 10 meters. The 3D-ISL is eyesafe and works with a visible semiconductor laser diode transmitting at 670 nm. The large ranging dynamic is achieved by measuring the phase difference between the transmitted and received intensity modulated signal. Due to the high modulation frequency of 314 MHz measurement accuracies about 0.1 mm are possible with high measurement rates. Besides the slant range, the system detects laser light backscattered from the object surface under survey. This means that three dimensional images are obtained, if the scanner moves the laserbeam line by line across the object's surface. After explaining the functioning of the 3D-ILS and calculating the theoretical slant ranging performance, typical application examples will be presented which verify the theoretical results and demonstrate the wide application field for the laser scanner which is e.g. CAD, CAM, rapid prototyping, close range-, industrial- and architectural-survey. An application highlight is the survey of a reconstructed skeleton of a dinosaur.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Aloysius Wehr "3D-imaging laser scanner for close-range metrology", Proc. SPIE 3707, Laser Radar Technology and Applications IV, (28 May 1999); https://doi.org/10.1117/12.351360
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CITATIONS
Cited by 8 scholarly publications.
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KEYWORDS
Laser scanners

Ranging

Modulation

Phase measurement

3D image processing

3D scanning

Semiconductor lasers

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