Paper
24 March 1999 Computer simulation of the fractional thermoluminescence in insulating crystals
Piotr Pietrucha, A. Opanowicz
Author Affiliations +
Abstract
Fractional thermoluminescence (FTL) is computer simulated using a model of an insulator with three kinds of active traps and one kind of recombination center. The trap depth values are determined from the calculated FTL curve using Gobrecht and Hofmann method modified by Chruscinska. The method yields the correct trap energy spectrum if the thermoluminescence curve having weakly overlapping peaks is analyzed. The trap depths determined with this method have values lower by about 10 to 25% than those used for the calculations.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Piotr Pietrucha and A. Opanowicz "Computer simulation of the fractional thermoluminescence in insulating crystals", Proc. SPIE 3724, International Conference on Solid State Crystals '98: Single Crystal Growth, Characterization, and Applications, (24 March 1999); https://doi.org/10.1117/12.342988
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KEYWORDS
Computer simulations

Electrons

Crystals

Semiconductors

Statistical analysis

Stereolithography

Thermal modeling

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