Galvanomagnetic and optical properties of CdTe wafers for substrates

V. V. Bogoboyashchiy

doi:10.1117/12.368360

4 November 1999 Galvanomagnetic and optical properties of CdTe wafers for substrates

V. V. Bogoboyashchiy

Proceedings Volume 3890, Fourth International Conference on Material Science and Material Properties for Infrared Optoelectronics; (1999) https://doi.org/10.1117/12.368360
Event: Material Science and Material Properties for Infrared Optoelectronics, 1998, Kiev, Ukraine

Abstract

Far IR engineering finds more and more broad applications in the most various purposes, for example, for monitoring technological processes, environment monitoring, in medicine, etc. Last year the significant successes are reached in the technology of matrix photoreceivers basing on an application of monocrystalline epitaxial films of p-type monocrystalline narrow-gap solid solutions, MCT, having a number of advantages on comparison to bulk MCT.

Citation Download Citation

V. V. Bogoboyashchiy "Galvanomagnetic and optical properties of CdTe wafers for substrates", Proc. SPIE 3890, Fourth International Conference on Material Science and Material Properties for Infrared Optoelectronics, (4 November 1999); https://doi.org/10.1117/12.368360

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