Paper
2 August 2000 Efficiency of secondary-electron detectors
Boris N. Vasichev, A. A. Melnikov, O. D. Potapkin
Author Affiliations +
Proceedings Volume 4187, Fourth All-Russian Seminar on Problems of Theoretical and Applied Electron Optics; (2000) https://doi.org/10.1117/12.394158
Event: Fourth All-Russian Seminar on Problems of Theoretical and Applied Electron Optics, 1999, Moscow, Russian Federation
Abstract
The collection coefficient for secondary electrons is calculated for a two-detector system. The coefficient is an important parameter that determines the accuracy of line-width measurements in electron beam plants. Calculations of the chamber electrostatic field for various boundary conditions are presented. Trajectories of secondary electrons are found.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Boris N. Vasichev, A. A. Melnikov, and O. D. Potapkin "Efficiency of secondary-electron detectors", Proc. SPIE 4187, Fourth All-Russian Seminar on Problems of Theoretical and Applied Electron Optics, (2 August 2000); https://doi.org/10.1117/12.394158
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KEYWORDS
Electrons

Sensors

Chemical elements

Electron beams

Electron beam lithography

Matrices

Optical design

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