Paper
30 April 2001 Quantification of specular image distinction in avionics active matrix liquid crystal display (AMLCD) applications
Peter N. Wyckoff, Steven D. Ellersick
Author Affiliations +
Proceedings Volume 4295, Flat Panel Display Technology and Display Metrology II; (2001) https://doi.org/10.1117/12.424876
Event: Photonics West 2001 - Electronic Imaging, 2001, San Jose, CA, United States
Abstract
With the proliferation of liquid crystal displays as the primary instrumentation interface on aircraft flight decks, it becomes important to quantify and control the unique optical parameters, associated with AMLCDs, that affect readability in a critical environment. It has been discovered that image distinctness, in addition to reflected energy intensity, can be a significant detriment to display readability. Consequently, efforts are being made to establish measurement procedures and quantify distinctness- of-image to help control the detrimental effects of this characteristic. Two measurement methods will be discussed that are currently being considered for use in describing the degree of specular distinctness-of-image reflections on avionics AMLCDs.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Peter N. Wyckoff and Steven D. Ellersick "Quantification of specular image distinction in avionics active matrix liquid crystal display (AMLCD) applications", Proc. SPIE 4295, Flat Panel Display Technology and Display Metrology II, (30 April 2001); https://doi.org/10.1117/12.424876
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Cited by 2 scholarly publications.
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KEYWORDS
LCDs

Reflectivity

Bidirectional reflectance transmission function

Air contamination

Glasses

Photometry

CRTs

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