Rare-earth-based spectral memories: material implications

Kent B. Hill; Alan E. Craig

doi:10.1117/12.485792

1 July 2003 Rare-earth-based spectral memories: material implications

Kent B. Hill, Alan E. Craig

Proceedings Volume 4988, Advanced Optical Data Storage; (2003) https://doi.org/10.1117/12.485792
Event: Integrated Optoelectronics Devices, 2003, San Jose, CA, United States

Abstract

Spectral hole burning material parameters that impact optical memory architecture and performance are investigated. Optical power budget analysis for the data storage process reveals that although narrow homogeneous linewidth can confer high data density, it does not optimally support high data rates. Trading narrow linewidth for higher oscillator strength would be desirable, if attainable. Experimental measurement of oscillator strengths, quantum yield into alternative hyperfine ground state levels, and persistence of the hyperfine level populations in Eu³⁺:Y₂SiO₅ and Pr³⁺:Y₂SiO₅ are presented and discussed. Quantum yield measurements of less than 25% indicate that spin projections are strongly preserved during excitation and relaxation processes. The hole depth consequently attainable from single π-pulse illumination requires trade-offs in memory system design.

Citation Download Citation

Kent B. Hill and Alan E. Craig "Rare-earth-based spectral memories: material implications", Proc. SPIE 4988, Advanced Optical Data Storage, (1 July 2003); https://doi.org/10.1117/12.485792

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