Paper
8 July 2003 Ray method for measurement of static deformations of optically rough surfaces
Author Affiliations +
Proceedings Volume 5036, Photonics, Devices, and Systems II; (2003) https://doi.org/10.1117/12.498257
Event: Photonics, Devices, and Systems II, 2002, Prague, Czech Republic
Abstract
The proposed method is based on the law of reflection and can be used for large reflective continuous surfaces, which behave approximately as a deformable mirror of a general type. For successful application of the ray method for deformation measurement is crucial the reflectivity of the surface. If the measured surface is optically rough, then the light is diffusely scattered in different directions relating to the microstructure of the surface, and the described method cannot be used. To limit the influence of the surface roughness the plastic reflective foil can be affixed on the test surface. The research was focused on several theoretical and experimental aspects of evaluation of the deformations with the ray method, especially on problems of measuring extended objects in engineering practice and automatic process for evaluation of deformations.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Antonin Miks and Jiri Novak "Ray method for measurement of static deformations of optically rough surfaces", Proc. SPIE 5036, Photonics, Devices, and Systems II, (8 July 2003); https://doi.org/10.1117/12.498257
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KEYWORDS
Reflectivity

Geometrical optics

Interferometry

Light scattering

Optical testing

Reflection

Moire patterns

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