Microsystem for measurement of impedance sensor parameters

Jerzy Hoja; Grzegorz Lentka

doi:10.1117/12.517130

22 September 2003 Microsystem for measurement of impedance sensors parameters

Jerzy Hoja, Grzegorz Lentka

Proceedings Volume 5124, Optoelectronic and Electronic Sensors V; (2003) https://doi.org/10.1117/12.517130
Event: Optoelectronic and Electronic Sensors V, 2002, Rzeszow, Poland

Abstract

The paper presents a measurement microsystem of parameters of impedance sensors characterized by impedance modulus in the range of 100Ω÷1GΩ. A wide frequency range (100μHz÷1MHz), especially at very low frequencies, has been achieved by the use of the DSP (Digital Signal Processing) technique. The simple construction assures low cost of the microsystem. The form of a virtual instrument has been used; the measurement module is connected via RS-232 interface to a personal computer. This solution allows using the microsystem to impedance spectroscopy of newly-developed sensors but also leads to a realization of dedicated microsystem with own display. The measurement error of impedance modulus and phase has been determined in relation to measurement frequency and measured impedance.

Citation Download Citation

Jerzy Hoja and Grzegorz Lentka "Microsystem for measurement of impedance sensors parameters", Proc. SPIE 5124, Optoelectronic and Electronic Sensors V, (22 September 2003); https://doi.org/10.1117/12.517130

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