Paper
1 July 2004 Vibrational Microspectroscopic Imaging: Spatial Resolution Enhancement
Sebastian Schlucker, Scott W. Huffman, Ira W. Levin
Author Affiliations +
Abstract
We propose a methodology for enhancing the diffraction limited spatial resolution attained in Raman and Fourier transform infrared microspectroscopic imaging techniques. Near-field scanning optical microscopy (SNOM) and spectroscopy employ apertureless and aperture approaches to provide ultra-high spatially resolved images at the nanometer level. In contrast, we employ conventional spectral acquisition schemes modified by spatial oversampling with the subsequent application of deconvolution techniques. As an example, this methodology is applied to flat samples using point illumination. Simulated data, assuming idealized sample concentration profiles, are presented together with experimental Raman microspectroscopic data from chemically and morphologically well-defined test samples. Intensity profiles determined using conventional mapping and imaging techniques are compared to those obtained by the probe/deconvolution methodology.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sebastian Schlucker, Scott W. Huffman, and Ira W. Levin "Vibrational Microspectroscopic Imaging: Spatial Resolution Enhancement", Proc. SPIE 5321, Biomedical Vibrational Spectroscopy and Biohazard Detection Technologies, (1 July 2004); https://doi.org/10.1117/12.528652
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Raman spectroscopy

Spatial resolution

Near field scanning optical microscopy

Deconvolution

Infrared imaging

Silicon

Spectroscopy

Back to Top